Automating GaN On-Wafer Pulse Measurements

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Gallium Nitride (GaN) devices have gained popularity due to higher efficiency, faster switching speeds, and compact size. But generating a proper model for these devices requires a set of complex and time-consuming measurements. It involves a large set of equipment to cover the high voltages and frequencies and the need for pulse measurements to avoid self-heating.

Keysight offers WaferPro Express to perform automated wafer-level measurements for semiconductor devices and provides turnkey drivers and test routines for a variety of instruments and wafer probers.

This webinar covers a show-case of WaferPro Express in combination with a probe station from FormFactor and PIV test equipment from Focus Microwaves. Join us and learn:

• How to save time when setting up a test plan, which drives all the necessary equipment and software for device characterization.
• How to fully automate on-wafer pulse IV/RF measurements on GaN devices.
• How dynamic RF calibration ensures accurate results by checking the validity of calibration while performing a long series of measurements.

Presenters

  • Abby Shih
    Device Modeling Application Engineer
    Keysight Technologies
    Abby Shih is a Device Modeling Application Engineer from Keysight EDA team responsible for Modeling Tools in EMEAI region. She has been working in Agilent Technologies/Keysight Technologies for more than 14 years and has experience with many types of models from baseband to RF development, extraction, as well as device measurements. She is originally from Taiwan and holds a Physics Bachelor and EE Master of Solid-State-Physics in NCTU.
  • Sajjad Ahmed
    Director Sales and Business Development
    Focus Microwaves
    Dr. Sajjad Ahmed earned his Master's in Electronics from the University of Gavle, Sweden, in 2008, and his Ph.D. in Electronics from the University of Limoges in 2012. He is currently the Director of Sales and Business Development at Focus Microwaves, bringing extensive expertise in RF and microwave testing, specializing in non-linear device characterization, load pull techniques, and advanced semiconductor testing at RF/microwave frequencies.

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Webinar: Automating GaN On-Wafer Pulse Measurements by DES Marketing